Accurate depth and normal maps from occlusion-aware focal stack symmetry
Published in IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2017
Access paper here
Use DBLP for bibtex citation
Recommended citation: M. Strecke, A. Alperovich, B. Goldluecke, "Accurate depth and normal maps from occlusion-aware focal stack symmetry." IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2017.
Download Paper